Author: Pan, Y.R.
Paper Title Page
WEPC157 Post-mortem Analysis at TLS 2352
  • Y.R. Pan, Y.-T. Chang, J. Chen, P.C. Chiu, K.T. Hsu, K.H. Hu, C.H. Kuo, C.-Y. Liao
    NSRRC, Hsinchu, Taiwan
  High availability and stability of the beam are important issues for the synchrotron light source. Analyzing of the post-mortem data is one of the most important approaches to reflect the machine error and identify the reason of beam trip. The post-mortem system has been developed at Taiwan Light Source (TLS) in 2008. This diagnostic data can provide useful information for troubleshooting and improve the beam reliability. The various diagnostic signals are read from hardware buffer and written to the file system by the post-mortem event trigger, which is generated by the signals of the beam trip detector, the superconducting RF system interlock and the superconducting insertion device interlock. In this report a processing is running to check whether a new trip event, promptly find out the unusual signals, and generate an analyzing result message. The detail will be discussed and summarized.