IPAC2011 - List of Authors (Noguchi, T.)

Paper	Title	Page
MOPC092	Effect of Current Densities on Sulfur Generation at Electropolished Niobium Surface	292
	P.V. Tyagi Sokendai, Ibaraki, Japan H. Hayano, S. Kato, M. Nishiwaki, T. Noguchi, T. Saeki, M. Sawabe KEK, Ibaraki, Japan
	We conducted a series of electropolishing (EP) experiments in aged EP acid with high (≈50 mA/cm²) and low (≈30 mA/cm²) current densities on Nb surfaces. The experiments were carried out both for laboratory coupons and a real Nb single cell cavity with six witness samples located at three typical positions (equator, iris and beam pipe). All the samples surface were investigated by XPS (x-ray photoelectron spectroscopy), SEM (scanning electron microscope) and EDX (energy dispersive x-ray spectroscopy). The surface analysis showed the EP with a high current density produced a huge amount sulfate particles at Nb surface whereas the EP with a low current density is very helpful to mitigate sulfate at Nb surface in both the experiments.

MOPC093	Novel Field Emission Scanner for Surface Study of Niobium SRF Cavity	295
	S. Kato, M. Nishiwaki, T. Noguchi KEK, Ibaraki, Japan V. Chouhan GUAS, Kanagawa, Japan P.V. Tyagi Sokendai, Ibaraki, Japan
	It is mandatory to investigate field emission on Nb SRF cavity systematically since strong field emission often limits the cavity performance. The field emission strength and the number of emission sites strongly depend on Nb surface properties which are determined by its surface treatment and handling. Field emission scanner (FES) developed allows us to measure a distribution of the field emitting sites over a sample surface at a given field strength along with its FE-SEM observation and energy dispersive x-ray analysis. FES consists of an anode needle driven by precise 3D stepping motors and an eucentric sample stage. The compact scanner was installed into the space between the object lens and the SEM sample holder. In addition, this system was newly equipped with a sample load-lock system for existing UHV suitcases. Therefore a sample coupon to be observed is hardly exposed to contaminants and dust particles during the transportation. In-situ heating of a sample coupon can be done during an experiment to simulate a baking process of a SRF cavity. This article describes development of the field emission scanner and its preliminary results of the application to niobium samples.

Paper

Title

Page

Effect of Current Densities on Sulfur Generation at Electropolished Niobium Surface

292

P.V. Tyagi
Sokendai, Ibaraki, Japan
H. Hayano, S. Kato, M. Nishiwaki, T. Noguchi, T. Saeki, M. Sawabe
KEK, Ibaraki, Japan

We conducted a series of electropolishing (EP) experiments in aged EP acid with high (≈50 mA/cm²) and low (≈30 mA/cm²) current densities on Nb surfaces. The experiments were carried out both for laboratory coupons and a real Nb single cell cavity with six witness samples located at three typical positions (equator, iris and beam pipe). All the samples surface were investigated by XPS (x-ray photoelectron spectroscopy), SEM (scanning electron microscope) and EDX (energy dispersive x-ray spectroscopy). The surface analysis showed the EP with a high current density produced a huge amount sulfate particles at Nb surface whereas the EP with a low current density is very helpful to mitigate sulfate at Nb surface in both the experiments.

MOPC093

Novel Field Emission Scanner for Surface Study of Niobium SRF Cavity

295

S. Kato, M. Nishiwaki, T. Noguchi
KEK, Ibaraki, Japan
V. Chouhan
GUAS, Kanagawa, Japan
P.V. Tyagi
Sokendai, Ibaraki, Japan

It is mandatory to investigate field emission on Nb SRF cavity systematically since strong field emission often limits the cavity performance. The field emission strength and the number of emission sites strongly depend on Nb surface properties which are determined by its surface treatment and handling. Field emission scanner (FES) developed allows us to measure a distribution of the field emitting sites over a sample surface at a given field strength along with its FE-SEM observation and energy dispersive x-ray analysis. FES consists of an anode needle driven by precise 3D stepping motors and an eucentric sample stage. The compact scanner was installed into the space between the object lens and the SEM sample holder. In addition, this system was newly equipped with a sample load-lock system for existing UHV suitcases. Therefore a sample coupon to be observed is hardly exposed to contaminants and dust particles during the transportation. In-situ heating of a sample coupon can be done during an experiment to simulate a baking process of a SRF cavity. This article describes development of the field emission scanner and its preliminary results of the application to niobium samples.