IPAC2011 - List of Authors (Kuhl, A.)

Paper	Title	Page
TUPC076	Realization of a High Bandwidth Bunch Arrival-time Monitor with Cone-shaped Pickup Electrodes for FLASH and XFEL	1177
	A. Angelovski, M. Hansli, R. Jakoby, A. Kuhl, A. Penirschke, S. Schnepp TU Darmstadt, Darmstadt, Germany M. Bousonville, H. Schlarb DESY, Hamburg, Germany T. Weiland TEMF, TU Darmstadt, Darmstadt, Germany
	Funding: Funded by the Federal Ministry of Education and Research (BMBF): 05K10RDA In the Free Electron Laser in Hamburg (FLASH) an electro-optical system is used as a Bunch Arrival time Monitor (BAM). The time-of-arrival resolution is proportional to the steepness of the beam pick-up signal at the first zero-crossing. Future experiments will be conducted using significantly lower bunch charges resulting in a reduced signal steepness. This requires BAM pickup electrodes with increased bandwidth as introduced in . This paper presents the implementation and measurement results of a high bandwidth cone-shaped pickup capable of operating in the frequency range up to 40 GHz. The slope steepness at the zero crossing is investigated for a simplified equivalent circuit model. RF-measurements have been performed using a non-hermetic prototype of the BAM pickups for assessing the influence of manufacturing tolerances on the sensor performance. The measurements are compared to simulation results obtained by CST PARTICLE STUDIO®. F. Loehl et al., Proc. of DIPAC2007, WEPB15, p. 262 (2007). ** A. Angelovski et al., "Pickup design for a high resolution Bunch Arrival time Monitor for FLASH and XFEL", DIPAC2011.

TUPC079	Sensitivity and Tolerance Analysis of a New Bunch Arrival-time Monitor Pickup Design for FLASH and XFEL	1186
	A. Kuhl, A. Angelovski, R. Jakoby, A. Penirschke, S. Schnepp TU Darmstadt, Darmstadt, Germany M. Bousonville, H. Schlarb DESY, Hamburg, Germany T. Weiland TEMF, TU Darmstadt, Darmstadt, Germany
	Funding: Supported by the Graduate School of Computational Engineering at TU Darmstadt and the Federal Ministry of Education and Research (BMBF): 05K10RDA "Weiterentwickung eines Ankunftszeitmonitors" The Free Electron Laser in Hamburg (FLASH) is equipped with Bunch Arrival Time Monitors (BAM), which provide for a time resolution of less than 10 fs for bunch charges higher than 0.2 nC. Future experiments, however, will aim at generating FEL light pulses from a broad range of bunch charges down to 10 pC. In these circumstances the requirements on the time resolution will no longer be fulfilled, which demands for a larger bandwidth of the pickup system. A new cone-shaped pickup, which has a bandwidth greater than 40 GHz has been proposed. At high frequencies, small manufacturing tolerances might have great influence on the pickup signal. A sensitivity analysis of several manufacturing tolerances in the pickup design regarding their influence on the output signal was carried out (by means of CST PARTICLE STUDIO®). These results are utilized for setting limits to the manufacturing tolerances. M.K. Bock et al., IPAC2010, WEOCMH02, Kyoto, Japan, 2010. ** A. Kuhl et al., "Design eines hochauflösenden Ankunftszeitmonitor für FLASH", DPG Frühjahrstagung 2011, Karlsruhe, Germany.

Paper

Title

Page

Realization of a High Bandwidth Bunch Arrival-time Monitor with Cone-shaped Pickup Electrodes for FLASH and XFEL

1177

A. Angelovski, M. Hansli, R. Jakoby, A. Kuhl, A. Penirschke, S. Schnepp
TU Darmstadt, Darmstadt, Germany
M. Bousonville, H. Schlarb
DESY, Hamburg, Germany
T. Weiland
TEMF, TU Darmstadt, Darmstadt, Germany

Funding: Funded by the Federal Ministry of Education and Research (BMBF): 05K10RDA
In the Free Electron Laser in Hamburg (FLASH) an electro-optical system is used as a Bunch Arrival time Monitor (BAM). The time-of-arrival resolution is proportional to the steepness of the beam pick-up signal at the first zero-crossing*. Future experiments will be conducted using significantly lower bunch charges resulting in a reduced signal steepness. This requires BAM pickup electrodes with increased bandwidth as introduced in **. This paper presents the implementation and measurement results of a high bandwidth cone-shaped pickup capable of operating in the frequency range up to 40 GHz. The slope steepness at the zero crossing is investigated for a simplified equivalent circuit model. RF-measurements have been performed using a non-hermetic prototype of the BAM pickups for assessing the influence of manufacturing tolerances on the sensor performance. The measurements are compared to simulation results obtained by CST PARTICLE STUDIO®.
* F. Loehl et al., Proc. of DIPAC2007, WEPB15, p. 262 (2007).
** A. Angelovski et al., "Pickup design for a high resolution Bunch Arrival time Monitor for FLASH and XFEL", DIPAC2011.

TUPC079

Sensitivity and Tolerance Analysis of a New Bunch Arrival-time Monitor Pickup Design for FLASH and XFEL

1186

A. Kuhl, A. Angelovski, R. Jakoby, A. Penirschke, S. Schnepp
TU Darmstadt, Darmstadt, Germany
M. Bousonville, H. Schlarb
DESY, Hamburg, Germany
T. Weiland
TEMF, TU Darmstadt, Darmstadt, Germany

Funding: Supported by the Graduate School of Computational Engineering at TU Darmstadt and the Federal Ministry of Education and Research (BMBF): 05K10RDA "Weiterentwickung eines Ankunftszeitmonitors"
The Free Electron Laser in Hamburg (FLASH) is equipped with Bunch Arrival Time Monitors (BAM)*, which provide for a time resolution of less than 10 fs for bunch charges higher than 0.2 nC. Future experiments, however, will aim at generating FEL light pulses from a broad range of bunch charges down to 10 pC. In these circumstances the requirements on the time resolution will no longer be fulfilled, which demands for a larger bandwidth of the pickup system. A new cone-shaped pickup, which has a bandwidth greater than 40 GHz has been proposed**. At high frequencies, small manufacturing tolerances might have great influence on the pickup signal. A sensitivity analysis of several manufacturing tolerances in the pickup design regarding their influence on the output signal was carried out (by means of CST PARTICLE STUDIO®). These results are utilized for setting limits to the manufacturing tolerances.
* M.K. Bock et al., IPAC2010, WEOCMH02, Kyoto, Japan, 2010.
** A. Kuhl et al., "Design eines hochauflösenden Ankunftszeitmonitor für FLASH", DPG Frühjahrstagung 2011, Karlsruhe, Germany.