Author: Kato, S.
Paper Title Page
MOPC092 Effect of Current Densities on Sulfur Generation at Electropolished Niobium Surface 292
 
  • P.V. Tyagi
    Sokendai, Ibaraki, Japan
  • H. Hayano, S. Kato, M. Nishiwaki, T. Noguchi, T. Saeki, M. Sawabe
    KEK, Ibaraki, Japan
 
  We conducted a series of electropolishing (EP) experiments in aged EP acid with high (≈50 mA/cm2) and low (≈30 mA/cm2) current densities on Nb surfaces. The experiments were carried out both for laboratory coupons and a real Nb single cell cavity with six witness samples located at three typical positions (equator, iris and beam pipe). All the samples surface were investigated by XPS (x-ray photoelectron spectroscopy), SEM (scanning electron microscope) and EDX (energy dispersive x-ray spectroscopy). The surface analysis showed the EP with a high current density produced a huge amount sulfate particles at Nb surface whereas the EP with a low current density is very helpful to mitigate sulfate at Nb surface in both the experiments.  
 
MOPC093 Novel Field Emission Scanner for Surface Study of Niobium SRF Cavity 295
 
  • S. Kato, M. Nishiwaki, T. Noguchi
    KEK, Ibaraki, Japan
  • V. Chouhan
    GUAS, Kanagawa, Japan
  • P.V. Tyagi
    Sokendai, Ibaraki, Japan
 
  It is mandatory to investigate field emission on Nb SRF cavity systematically since strong field emission often limits the cavity performance. The field emission strength and the number of emission sites strongly depend on Nb surface properties which are determined by its surface treatment and handling. Field emission scanner (FES) developed allows us to measure a distribution of the field emitting sites over a sample surface at a given field strength along with its FE-SEM observation and energy dispersive x-ray analysis. FES consists of an anode needle driven by precise 3D stepping motors and an eucentric sample stage. The compact scanner was installed into the space between the object lens and the SEM sample holder. In addition, this system was newly equipped with a sample load-lock system for existing UHV suitcases. Therefore a sample coupon to be observed is hardly exposed to contaminants and dust particles during the transportation. In-situ heating of a sample coupon can be done during an experiment to simulate a baking process of a SRF cavity. This article describes development of the field emission scanner and its preliminary results of the application to niobium samples.  
 
WEPC135 Recent Developments in Modeling Time-resolved Shielded-pickup Measurements of Electron Cloud Buildup at CESRTA 2313
 
  • J.A. Crittenden, Y. Li, X. Liu, M.A. Palmer, J.P. Sikora
    CLASSE, Ithaca, New York, USA
  • R.P. Badman
    Syracuse University, Syracuse, USA
  • S. Calatroni, G. Rumolo
    CERN, Geneva, Switzerland
  • S. Kato
    KEK, Ibaraki, Japan
 
  Funding: Work supported by the U.S. National Science Foundation PHY-0734867, PHY-1002467 and the U.S. Department of Energy DE-FC02-08ER41538
The Cornell Electron Storage Ring Test Accelerator program includes investigations into the mitigation of electron cloud buildup using a variety of techniques in custom vacuum chambers. The CESR ring accommodates two such chambers equipped with BPM-style pickup detectors shielded against the direct beam-induced signal. The signals provide time-resolved information on cloud development. Results for diamond-like carbon, amorphous carbon, and TiN coatings have been compared to those for an uncoated aluminum chamber. Here we report on extensions to the ECLOUD modeling code which refine its description of a variety of new types of in situ vacuum chamber comparisons. Our results highlight the sensitivity afforded by these measurements to the modeled photoelectron production and secondary yield parameters. We draw conclusions comparing the photoelectron and secondary yield properties of the various vacuum chamber coatings, including conditioning effects as a function of synchrotron radiation dose. We find substantial conditioning effects in both the quantum efficiency for producing photoelectrons and in the secondary yield.