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BiBTeX citation export for TUPV050: Control System Upgrade of the High-Pressure Cell for Pressure-Jump X-Ray Diffraction

@inproceedings{mercado:icalepcs2021-tupv050,
  author       = {R. Mercado and N.L. Griffin and P. Holloway and S.C. Lay and P.J. Roberts},
  title        = {{Control System Upgrade of the High-Pressure Cell for Pressure-Jump X-Ray Diffraction}},
  booktitle    = {Proc. ICALEPCS'21},
  pages        = {524--527},
  eid          = {TUPV050},
  language     = {english},
  keywords     = {controls, EPICS, operation, network, detector},
  venue        = {Shanghai, China},
  series       = {International Conference on Accelerator and Large Experimental Physics Control Systems},
  number       = {18},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {03},
  year         = {2022},
  issn         = {2226-0358},
  isbn         = {978-3-95450-221-9},
  doi          = {10.18429/JACoW-ICALEPCS2021-TUPV050},
  url          = {https://jacow.org/icalepcs2021/papers/tupv050.pdf},
  abstract     = {{This paper reports on the upgrade of the control system of a sample environment used to pressurise samples to 500 MPa at temperatures between -20 °C and 120 °C. The equipment can achieve millisecond pressure jumps for use in X-ray scattering experiments. It has been routinely available in beamline I22 at Diamond. The millisecond pressure-jump capability is unique. Example applications were the demonstration of pressure-induced formation of super crystals from PEGylated gold nanoparticles and the study of controlled assembly and disassembly of nanoscale protein cages. The project goal was to migrate the control system for the improved integration to EPICS and the GDA data acquisition software. The original control system uses National Instruments hardware controlled from LabView. The project looked at mapping the old control system hardware to alternatives in use at Diamond and migrating the control software. The paper discusses the choice of equipment used for ADC acquisition and equipment protection, using Omron PLCs and Beckhoff EtherCAT modules, a custom jump-trigger circuit, the calibration of the system and the next steps for testing the system.}},
}