This study conducted offline calibration tests on the stripline Beam Position Monitor (BPM) designed for the Hefei Advanced Light Facility (HALF) injector. The Lambertson method was used to measure the off-set between the electrical center and the mechanical center of the BPM, with results showing horizontal and vertical offsets of 0.1154 mm and 0.1661 mm, respec-tively. Additionally, the wire-scan method was em-ployed to construct the BPM mapping, and polynomial fitting was applied to effectively reduce the BPM’s nonlinearity and system errors. The experimental re-sults provide essential data support for the optimiza-tion and practical application of the BPM in the HALF injector.

This paper presents a bunch-by-bunch profile measurement system, which includes an optical imaging frontend, a multi-channel photomultiplier tube (MAPMT) for photoelectric conversion, and a high-sampling-rate oscilloscope for data recording. The system is capable of measuring the transverse positions and sizes of each bunch in the storage ring during the beam availability period of the Hefei Light Source II (HLS-II). By finely processing the collected data, the system can effectively recognize the dynamic characteristics of the beams and monitor the performance of the light source. Here, the paper elaborates on the system’s design principles, optical layout and system configuration. It also introduces the program workflow of data processing, along with an analysis of the corresponding measurement errors.

To address non-standard Gaussian beam spot pro-files in injectors, this paper proposes a fitting algo-rithm based on Gaussian, the newly introduced Gener-alized Gaussian Type and Skewed Gaussian Type dis-tributions. These distributions are specifically de-signed to better fit non-Gaussian and asymmetric beam spots by automatically selecting the most suitable model. Validation using beam spot images from the YAG screen after the electron gun in the Hefei Light Source II (HLS-II) injector demonstrates that the Gen-eralized Gaussian Type is effective for fitting sharp or broad profiles, while the Skewed Gaussian Type is well-suited for handling asymmetry. Compared to tra-ditional methods, the proposed algorithm improves fitting accuracy and adaptability, providing a practical solution for complex beam measurement challenges.