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RIS citation export for WEP009: Emittance Measurement of RF Ion Source in CSNS

TY  - UNPB
AU  - Li, F.
ED  - Schaa, Volker R.W.
ED  - Batten, Tonia
ED  - Bree, Michael
ED  - Petit-Jean-Genaz, Christine
ED  - Hunter, Darren
TI  - Emittance Measurement of RF Ion Source in CSNS
J2  - Proc. of IBIC2023, Saskatoon, Canada, 10-14 September 2023
CY  - Saskatoon, Canada
T2  - International Beam Instrumentation Conference
T3  - 12
LA  - english
AB  - The emittance reflectes the quality of the beam which is an important parameter of ion source. Oscillation of emittance and Twiss parameters in the negative ion (H⁻) beam is measured by application of a double-slit emittance monitor located at the RFQ entrance. The systematic error was valued in emittance measurement of CSNS RF ion source. This article mainly discussed the measurement accuracy and reliability of the double-slit emittance meter. Therefore it is shown that the working principle, mechanical disign, electronics and the application in CSNS RF ion source were introduced.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
ER  -