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BiBTeX citation export for WEP009: Emittance Measurement of RF Ion Source in CSNS

@unpublished{li:ibic2023-wep009,
  author       = {F. Li},
  title        = {{Emittance Measurement of RF Ion Source in CSNS}},
% booktitle    = {Proc. IBIC'23},
  booktitle    = {Proc. Int. Beam Instrum. Conf. (IBIC'23)},
  language     = {english},
  intype       = {presented at the},
  series       = {International Beam Instrumentation Conference},
  number       = {12},
  venue        = {Saskatoon, Canada},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {12},
  year         = {2023},
  note         = {presented at IBIC'23 in Saskatoon, Canada, unpublished},
  abstract     = {{The emittance reflectes the quality of the beam which is an important parameter of ion source. Oscillation of emittance and Twiss parameters in the negative ion (H⁻) beam is measured by application of a double-slit emittance monitor located at the RFQ entrance. The systematic error was valued in emittance measurement of CSNS RF ion source. This article mainly discussed the measurement accuracy and reliability of the double-slit emittance meter. Therefore it is shown that the working principle, mechanical disign, electronics and the application in CSNS RF ion source were introduced.}},
}