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RIS citation export for WE3C02: Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing

TY  - CONF
AU  - Shin, B.K.
AU  - Chung, M.
AU  - Hahn, G.
AU  - Sung, C.K.
ED  - Schaa, Volker R.W.
ED  - Batten, Tonia
ED  - Bree, Michael
ED  - Petit-Jean-Genaz, Christine
ED  - Hunter, Darren
TI  - Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing
J2  - Proc. of IBIC2023, Saskatoon, Canada, 10-14 September 2023
CY  - Saskatoon, Canada
T2  - International Beam Instrumentation Conference
T3  - 12
LA  - english
AB  - We have developed a highly precise 4D emittance meter for X-Y coupled beams with 4D phase-space (x-x’, y-y’, x-y’, y-x’) which utilizes an L-shaped slit and employs novel analysis techniques. Our approach involves two types of slit-screen image processing to generate pepper-pot-like images with great accuracy. One which we call the "differential slit" method, was developed by our group. This approach involves combining two slit-screen images, one at position x and the other at position x + the size of the slit, to create a differential slit image. The other method we use is the "virtual pepper-pot (VPP)" method, which combines x-slit and y-slit images to produce a hole (x,y) image. By combining that hole images, we are able to take extra x-y’ and y-x’ phase-space. The "differential slit" method is crucial for accurately measuring emittance. Through simulations with 0.1 mm slit width using Geant4, the emittance uncertainties for a 5 nm rad and 0.2 mm size electron beam were 5% and 250% with and without the "differential slit", respectively. In this presentation, we provide a description of the methodology, the design of slit, and the results of the 4D emittance measurements.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 318
EP  - 320
KW  - emittance
KW  - simulation
KW  - experiment
KW  - electron
KW  - background
DA  - 2023/12
PY  - 2023
SN  - 2673-5350
SN  - 978-3-95450-236-3
DO  - doi:10.18429/JACoW-IBIC2023-WE3C02
UR  - https://jacow.org/ibic2023/papers/we3c02.pdf
ER  -