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BiBTeX citation export for WE3C02: Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing

@inproceedings{shin:ibic2023-we3c02,
  author       = {B.K. Shin and M. Chung and G. Hahn and C.K. Sung},
  title        = {{Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing}},
% booktitle    = {Proc. IBIC'23},
  booktitle    = {Proc. 12th Int. Beam Instrum. Conf. (IBIC'23)},
  eventdate    = {2023-09-10/2023-09-14},
  pages        = {318--320},
  paper        = {WE3C02},
  language     = {english},
  keywords     = {emittance, simulation, experiment, electron, background},
  venue        = {Saskatoon, Canada},
  series       = {International Beam Instrumentation Conference},
  number       = {12},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {12},
  year         = {2023},
  issn         = {2673-5350},
  isbn         = {978-3-95450-236-3},
  doi          = {10.18429/JACoW-IBIC2023-WE3C02},
  url          = {https://jacow.org/ibic2023/papers/we3c02.pdf},
  abstract     = {{We have developed a highly precise 4D emittance meter for X-Y coupled beams with 4D phase-space (x-x’, y-y’, x-y’, y-x’) which utilizes an L-shaped slit and employs novel analysis techniques. Our approach involves two types of slit-screen image processing to generate pepper-pot-like images with great accuracy. One which we call the "differential slit" method, was developed by our group. This approach involves combining two slit-screen images, one at position x and the other at position x + the size of the slit, to create a differential slit image. The other method we use is the "virtual pepper-pot (VPP)" method, which combines x-slit and y-slit images to produce a hole (x,y) image. By combining that hole images, we are able to take extra x-y’ and y-x’ phase-space. The "differential slit" method is crucial for accurately measuring emittance. Through simulations with 0.1 mm slit width using Geant4, the emittance uncertainties for a 5 nm rad and 0.2 mm size electron beam were 5% and 250% with and without the "differential slit", respectively. In this presentation, we provide a description of the methodology, the design of slit, and the results of the 4D emittance measurements.}},
}