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RIS citation export for TUP041: APS Upgrade Radiation Safety Beam Current Interlock

TY  - CONF
AU  - Keane, R.T.
AU  - Caracappa, A.
AU  - Danneil, C.
AU  - Ha, K.
AU  - Harkay, K.C.
AU  - Mead, J.
AU  - Padrazo, D.
AU  - Sereno, N.
ED  - Schaa, Volker R.W.
ED  - Batten, Tonia
ED  - Bree, Michael
ED  - Petit-Jean-Genaz, Christine
ED  - Hunter, Darren
TI  - APS Upgrade Radiation Safety Beam Current Interlock
J2  - Proc. of IBIC2023, Saskatoon, Canada, 10-14 September 2023
CY  - Saskatoon, Canada
T2  - International Beam Instrumentation Conference
T3  - 12
LA  - english
AB  - The Advanced Photon Source upgrade (APS-U) Multi-Bend Acromat (MBA) storage ring utilizes on-axis swap-out injection requiring up to 20nC charge per electron bunch. Enforcement of radiation safety limits for the new storage ring will be accomplished by a new beam charge monitor interlock that accumulates beam charge measurements in the Booster-to-Storage ring (BTS) transfer line and disables injection when the charge limit over a preset time period is exceeded. The new interlock is based on the existing APS Beam Shut-Off Current Monitor (BESOCM), and incorporates significant improvements over the existing system. New features include use of direct digitization and FPGA processing, extensive remote monitoring capabilities, expanded self-test and fail-safe functions, and the ability to adjust settings and monitor status remotely via EPICS. The new device integrates a test pulse (self-check) feature that verifies the integrity of the integrating beam current transformer (ICT) and cable system used to detect the beam signal. This paper describes the new BTS interlock (BESOCM) design and presents results of bench test and in-machine evaluation of the prototype and production units.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 281
EP  - 284
KW  - FPGA
KW  - controls
KW  - operation
KW  - timing
KW  - radiation
DA  - 2023/12
PY  - 2023
SN  - 2673-5350
SN  - 978-3-95450-236-3
DO  - doi:10.18429/JACoW-IBIC2023-TUP041
UR  - https://jacow.org/ibic2023/papers/tup041.pdf
ER  -