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BiBTeX citation export for WEP28: Studies on Radially Coupled Fast Faraday Cups to Minimize Field Dilution and Secondary Electron Emission at Low Intensities of Heavy Ions

@inproceedings{rodrigues:ibic2022-wep28,
  author       = {G.O. Rodrigues and S. Kumar and K. Mal and R. Mehta and C.P. Safvan and R. Singh},
  title        = {{Studies on Radially Coupled Fast Faraday Cups to Minimize Field Dilution and Secondary Electron Emission at Low Intensities of Heavy Ions}},
& booktitle    = {Proc. IBIC'22},
  booktitle    = {Proc. 11th Int. Beam Instrum. Conf. (IBIC'22)},
  pages        = {460--464},
  eid          = {WEP28},
  language     = {english},
  keywords     = {impedance, electron, insertion, simulation, operation},
  venue        = {Kraków, Poland},
  series       = {International Beam Instrumentation Conference},
  number       = {11},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {12},
  year         = {2022},
  issn         = {2673-5350},
  isbn         = {978-3-95450-241-7},
  doi          = {10.18429/JACoW-IBIC2022-WEP28},
  url          = {https://jacow.org/ibic2022/papers/wep28.pdf},
  abstract     = {{Fast Faraday Cups (FFCs) are interceptive beam diagnostic devices used to measure fast signals from sub-nanosecond bunched beams and the operation of these devices is a well-established technique. However, for short bunch length measurements in non-relativistic regimes with ion beams, the measured profile is diluted due to field elongation and distortion by the emission of secondary electrons. Additionally, for short bunches with the expected intensities envisaged in the High Current Injector at the Inter University Accelerator Centre, the impedance matching of the EM structure puts severe design constraints. This work presents a detailed study on the modification of a radially-coupled coaxial FFC [1]. The field dilution and secondary electron emission aspects are modelled through EM simulations and techniques to minimise these effects are explored. This has resulted in a new design, which has a better signal to noise ratio and benefits from a more accurate bunched beam measurement.}},
}