Author: Jankowiak, A.
Paper Title Page
WEOA04 Bunch-Resolved 2D Diagnostics - Streaking Combined with Interferometry 332
 
  • M. Koopmans, J.-G. Hwang, A. Jankowiak, M. Ries, G. Schiwietz
    HZB, Berlin, Germany
 
  Due to the complexity of the filling pattern in the BESSY II electron-storage ring, bunch-resolved diagnostics are required for machine commissioning and to ensure the long-term quality and stability of operation. In addition, low-alpha operation and a possible VSR upgrade demand bunch-length measurements with picosecond resolution. Therefore, a dedicated beamline equipped with a fast streak camera was set up and successfully commissioned. Couplings between time- and space-coordinates also call for bunch-selective and correlated multi-parameter detection methods. Thus, the beamline and the streak camera have been made capable of direct beam-profile imaging and interferometry of the vertical beam size using the X-ray blocker baffle method *,**. The horizontal or vertical dimension can additionally be imaged with the streak camera and bunch-resolved 2D measurements are possible. Imaging the vertical direction, the characteristic dip in the center the interference pattern from pi-polarized synchrotron radiation can be observed and is used to extract bunch resolved information about the vertical beam size. The streak camera measurements are validated with direct imaging measurements from a regular CCD camera at the beamline and compared to model calculations. The results are converted into absolute values by a calibration with the BESSY II pinhole monitors.
* J. Breunlin et al., Nucl. Instrum. Methods A803 (2015) 55-64.
** M. Koopmans et al., in: Proc. IPAC’19, Melbourne, Australia, pp. 2491-2494,
http://dx.doi.org/10.18429/JACoW-IPAC2019-WEPGW012.
 
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DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2021-WEOA04  
About • paper received ※ 02 September 2021       paper accepted ※ 17 September 2021       issue date ※ 09 October 2021  
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