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RIS citation export for WEPP35: EPICS Control System for RAON Diagnostics

TY  - CONF
AU  - Lim, E.H.
AU  - Chung, Y.S.
AU  - Kim, E.-S.
AU  - Kim, G.D.
AU  - Kwon, J.W.
AU  - Woo, H.J.
ED  - Kim, Changbum
ED  - Schaa, Volker R. W.
ED  - Kim, Dong-Eon
ED  - Lee, Jaeyu
TI  - EPICS Control System for RAON Diagnostics
J2  - Proc. of IBIC2021, Pohang, Rep. of Korea, 24-28 May 2021
CY  - Pohang, Rep. of Korea
T2  - International Beam Instrumentation Conference
T3  - 10
LA  - english
AB  - RAON has various diagnostic devices for measuring beam characteristics, such as Faraday Cup, Wire Scanner, and Beam Loss Monitor, etc. Each device is driven by PLC system and acquires current data with a DAQ based uTCA system. All the parameters are controlled by EPICS as process variables (PV) and monitored on GUI of CS-Studio. PVs of PLC and DAQ were named according to the RAON naming convention. Epics sequences are written in finite state machine code to work diagnostic device sequentially. Below we show the working principle of the epics based diagnostics devices control system and measurement results.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 449
EP  - 451
KW  - controls
KW  - EPICS
KW  - diagnostics
KW  - operation
KW  - status
DA  - 2021/10
PY  - 2021
SN  - 2673-5350
SN  - 978-3-95450-230-1
DO  - doi:10.18429/JACoW-IBIC2021-WEPP35
UR  - https://jacow.org/ibic2021/papers/wepp35.pdf
ER  -