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BiBTeX citation export for WEPP35: EPICS Control System for RAON Diagnostics

@inproceedings{lim:ibic2021-wepp35,
  author       = {E.H. Lim and Y.S. Chung and E.-S. Kim and G.D. Kim and J.W. Kwon and H.J. Woo},
  title        = {{EPICS Control System for RAON Diagnostics}},
  booktitle    = {Proc. IBIC'21},
  pages        = {449--451},
  eid          = {WEPP35},
  language     = {english},
  keywords     = {controls, EPICS, diagnostics, operation, status},
  venue        = {Pohang, Rep. of Korea},
  series       = {International Beam Instrumentation Conference},
  number       = {10},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {10},
  year         = {2021},
  issn         = {2673-5350},
  isbn         = {978-3-95450-230-1},
  doi          = {10.18429/JACoW-IBIC2021-WEPP35},
  url          = {https://jacow.org/ibic2021/papers/wepp35.pdf},
  note         = {https://doi.org/10.18429/JACoW-IBIC2021-WEPP35},
  abstract     = {{RAON has various diagnostic devices for measuring beam characteristics, such as Faraday Cup, Wire Scanner, and Beam Loss Monitor, etc. Each device is driven by PLC system and acquires current data with a DAQ based uTCA system. All the parameters are controlled by EPICS as process variables (PV) and monitored on GUI of CS-Studio. PVs of PLC and DAQ were named according to the RAON naming convention. Epics sequences are written in finite state machine code to work diagnostic device sequentially. Below we show the working principle of the epics based diagnostics devices control system and measurement results.}},
}