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TY - CONF AU - Zhou, Y.M. AU - Cao, S.S. AU - Chen, J. AU - Leng, Y.B. ED - Kim, Changbum ED - Schaa, Volker R. W. ED - Kim, Dong-Eon ED - Lee, Jaeyu TI - Bunch Arrival Time Measurement System Test for SHINE J2 - Proc. of IBIC2021, Pohang, Rep. of Korea, 24-28 May 2021 CY - Pohang, Rep. of Korea T2 - International Beam Instrumentation Conference T3 - 10 LA - english AB - To achieve high-precision synchronization between electron bunches and seeded lasers, a femto-second resolution bunch arrival time measurement system (BAM) is required at SHINE (Shanghai High repetition rate XFEL aNd Extreme light facility). The bunch signal from a GHz-bandwidth cavity monitor is mixed with a reference signal from the device synchronization clock in the RF front-end. Then, the generated IF signal is collected by the digital acquisition system. In the pre-research stage, four sets of cavity monitors with different frequencies and load quality factors and three sets of analog front-ends with different schemes were performed, but now only one monitor with the attenuation time constant of 200 ns was installed for beam experiment testing. The system can measure the bunch charge, bunch arrival time, and bunch flight time. The first results will be presented in this paper. PB - JACoW Publishing CP - Geneva, Switzerland SP - 396 EP - 399 KW - cavity KW - experiment KW - FEL KW - extraction KW - data-acquisition DA - 2021/10 PY - 2021 SN - 2673-5350 SN - 978-3-95450-230-1 DO - doi:10.18429/JACoW-IBIC2021-WEPP13 UR - https://jacow.org/ibic2021/papers/wepp13.pdf ER -