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https://doi.org/10.18429/JACoW-IBIC2021-TUOA01
Title Single-Crystal Diamond Pixelated Radiation Detector with Buried Graphitic Electrodes
Authors
  • C. Bloomer, L. Bobb
    DLS, Oxfordshire, United Kingdom
  • M.E. Newton
    University of Warwick, Coventry, United Kingdom
Abstract A new type of transmissive pixel detector has been developed for synchrotron radiation diagnostics at Diamond Light Source. A thin single-crystal CVD diamond plate is used as the detector material, and a pulsed-laser technique has been used to write conductive graphitic electrodes inside the diamond plate. Instead of using traditional electrodes formed from a layer of surface metallisation, the graphitic electrodes are buried under the surface of the diamond and result in an all-carbon imaging detector. Within the instrument’s transmissive aperture there are no surface structures that could be damaged by exposure to radiation beams, and no surface metallization that could introduce unwanted absorption edges. The instrument has successfully been used to image the X-ray beam profile and measure the beam position to sub-micron accuracy at 100 Hz at Diamond Light Source. A novel modulation lock-in technique is used to read out all pixels simultaneously. Presented in this work are measurements of the detector’s beam position resolution and intensity resolution. Initial measurements of the instrument’s spread-function are also presented. Numerical simulations are used to identify potential improvements to the electrode geometry to improve the spatial resolution of similar future detectors. The instrument has applications in both synchrotron radiation instrumentation, where real-time monitoring of the beam profile is useful for beam diagnostics and fault-finding, and particle tracking at colliders, where the electrode geometries that buried graphitic tracks can provide increased the charge collection efficiency of the detector.
Paper download TUOA01.PDF [1.187 MB / 9 pages]
Slides download TUOA01_TALK.PDF [16.620 MB]
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Conference IBIC2021
Series International Beam Instrumentation Conference (10th)
Location Pohang, Rep. of Korea
Date 24-28 May 2021
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Changbum Kim (PAL, Pohang, Rep. of Korea); Volker R. W. Schaa (GSI, Darmstadt, Germany); Dong-Eon Kim (PAL, Pohang, Rep. of Korea); Jaeyu Lee (PAL, Pohang, Rep. of Korea)
Online ISBN 978-3-95450-230-1
Online ISSN 2673-5350
Received 03 September 2021
Accepted 15 September 2021
Issue Date 11 October 2021
DOI doi:10.18429/JACoW-IBIC2021-TUOA01
Pages 158-166
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.