| Title |
Prototype Design of Wire Scanner for SHINE |
| Authors |
- J. Wan
SINAP, Shanghai, People’s Republic of China
- F.Z. Chen, J. Chen, B. Gao, Y.B. Leng, K.R. Ye, L.Y. Yu, W.M. Zhou
SSRF, Shanghai, People’s Republic of China
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| Abstract |
SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed.
|
| Paper |
download THPP36.PDF [0.993 MB / 3 pages] |
| Poster |
download THPP36_POSTER.PDF [1.787 MB] |
| Export |
download ※ BibTeX
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※ EndNote |
| Conference |
IBIC2020 |
| Series |
International Beam Instrumentation Conference (9th) |
| Location |
Santos, Brazil |
| Date |
14-18 September 2020 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Daniel Tavares (LNLS, Campinas, Brazil); Renan Picoreti (LNLS, Campinas, Brazil); Gustavo Bruno (LNLS, Campinas, Brazil); Sergio Marques (LNLS, Campinas, Brazil); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| Online ISBN |
978-3-95450-222-6 |
| Online ISSN |
2673-5350 |
| Received |
31 August 2020 |
| Accepted |
18 September 2020 |
| Issue Date |
30 October 2020 |
| DOI |
doi:10.18429/JACoW-IBIC2020-THPP36 |
| Pages |
285-287 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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