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| MOPC11 |
Data Acquisition System for Beam Instrumentation of SXFEL and DCLS |
137 |
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- Y.B. Yan
SINAP, Shanghai, People’s Republic of China
- J. Chen, L.W. Lai, Y.B. Leng, C.L. Yu, L.Y. Yu, H. Zhao, W.M. Zhou
SSRF, Shanghai, People’s Republic of China
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The high-gain free electron lasers have given scientists hopes for new scientific discoveries in many frontier research areas. The Shanghai X-Ray Free-Electron Laser (SXFEL) test facility is commissioning at the SSRF campus. The Dalian Coherent Light Source (DCLS) has successfully commissioned in the northeast of China, which is the brightest vacuum ultraviolet free electron laser facility. The data acquisition system for beam instrumentation is based on EPICS platform. The field programmable gate array (FPGA) and embedded controller are adopted for the signal processing and device control. The high-level applications are developed using Python. The details of the data acquisition system will be reported in this paper.
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2018-MOPC11
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| About • |
paper received ※ 29 August 2018 paper accepted ※ 11 September 2018 issue date ※ 29 January 2019 |
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