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TY - CONF AU - Mariet, A. AU - Veness, R. ED - Schaa, Volker RW TI - Selection of Wires for the New Generation of Fast Wire Scanners at CERN J2 - Proc. of IBIC2018, Shanghai, China, 09-13 September 2018 CY - Shanghai, China T2 - International Beam Instrumentation Conference T3 - 7 LA - english AB - A new generation of fast wire scanners is being produced as part of the LHC Injector Upgrade (LIU) project at CERN. The LIU beam parameters imply that these wire scanners will need to operate with significantly brighter beams. This requires wires scanner systems with micron level accuracy and wires with a considerably increased tolerance to beam damage. This paper presents the method of selection of such wires in terms of material choice and geometry. It also reports on studies with novel materials with a potential to further extend the reach of wire scanners for high brightness beams. PB - JACoW Publishing CP - Geneva, Switzerland SP - 523 EP - 526 KW - acceleration KW - proton KW - synchrotron KW - brightness KW - ECR DA - 2019/01 PY - 2019 SN - 978-3-95450-201-1 DO - DOI: 10.18429/JACoW-IBIC2018-WEPC19 UR - http://jacow.org/ibic2018/papers/wepc19.pdf ER -