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TY - CONF AU - Lensch, T. AU - Liu, S. AU - Scholz, M. ED - Schaa, Volker RW TI - The European XFEL Wire Scanner System J2 - Proc. of IBIC2018, Shanghai, China, 09-13 September 2018 CY - Shanghai, China T2 - International Beam Instrumentation Conference T3 - 7 LA - english AB - The European-XFEL (E-XFEL) is an X-ray Free Electron Laser facility located in Hamburg (Germany). The superconducting accelerator for up to 17.5 GeV electrons will provide photons simultaneously to several user stations. Currently 12 Wire Scanner units are used to image transverse beam profiles in the high energy sections. These scanners provide a slow scan mode which is currently used to measure beam emittance and beam halo distributions. When operating with long bunch trains (>100 bunches) also fast scans are planned to measure beam sizes in an almost nondestructive manner. Scattered electrons can be detected with regular Beam Loss Monitors (BLM) as well as dedicated wire scanner detectors. Latter are installed in different variants at certain positions in the machine. Further developments are ongoing to optimize the sensitivity of the detectors to be able to measure both, beam halo and beam cores within the same measurement with the same detector. This paper describes the current status of the system and examples of different slow scan measurements. PB - JACoW Publishing CP - Geneva, Switzerland SP - 498 EP - 500 KW - detector KW - FEL KW - optics KW - collimation KW - undulator DA - 2019/01 PY - 2019 SN - 978-3-95450-201-1 DO - DOI: 10.18429/JACoW-IBIC2018-WEPC05 UR - http://jacow.org/ibic2018/papers/wepc05.pdf ER -