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RIS citation export for WEPB10: Grating Scanner for Measurement of Micron-size Beam Profiles

TY  - CONF
AU  - Sukhikh, L.G.
AU  - Kube, G.
AU  - Potylitsyn, A.
AU  - Strokov, S.A.
AU  - Wittenburg, K.
ED  - Schaa, Volker RW
TI  - Grating Scanner for Measurement of Micron-size Beam Profiles
J2  - Proc. of IBIC2018, Shanghai, China, 09-13 September 2018
CY  - Shanghai, China
T2  - International Beam Instrumentation Conference
T3  - 7
LA  - english
AB  - Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire. The smallest carbon or tungsten wires used so far have diameters of about 4 microns. With the development of modern electron accelerators and the demands from future linear electron-positron colliders, sub-micron beam sizes have to be resolved. In order to increase the resolution, the decrease of the wire diameter is required. The authors of Ref. * proposed to manufacture thin gold stripes of rectangular shape (widths are equal to 1 µm or 2 µm and height is equal to 3 µm) on Si₃N₄ membrane. We propose to use another arrangement of gold stripes with varying period on a Si substrate. A set of 11 stripes with 1 µm width and 10 micron height with varying gap width in the range 3-0.25 µm ("grating scanner") was simulated by using an analytical model and by the Geant4 code. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 448
EP  - 450
KW  - electron
KW  - photon
KW  - simulation
KW  - positron
KW  - collider
DA  - 2019/01
PY  - 2019
SN  - 978-3-95450-201-1
DO  - DOI: 10.18429/JACoW-IBIC2018-WEPB10
UR  - http://jacow.org/ibic2018/papers/wepb10.pdf
ER  -