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TY - CONF AU - Cao, S.S. AU - Chen, J. AU - Leng, Y.B. AU - Yuan, R.X. ED - Schaa, Volker RW TI - The Application of Beam Arrival Time Measurement at SXFEL J2 - Proc. of IBIC2018, Shanghai, China, 09-13 September 2018 CY - Shanghai, China T2 - International Beam Instrumentation Conference T3 - 7 LA - english AB - Shanghai soft X-ray free electron laser (SXFEL) is able to generate high brightness and ultra-short light pulses. The generation of the light sources relies on the synchronization between seeded laser and electron bunch. Beam arrival time play an important role to keep the synchronization. For the SXFEL, a beam arrival time resolution under 100 fs is required. In this paper, the application of beam arrival time measurement scheme on SXFEL has been presented. The whole BAM system consists of four parts: beam arrival time monitor, electronic front-end, signal acquisition system, and high-level signal processing and presentation. Currently, four sets of beam arrival time monitors (BAMs) have been installed in the SXFEL and distributed in four different locations. The relevant beam arrival time experiment and beam flight time experiment based on the dual-cavities mixing method have also been performed so as to evaluate and analyze the beam status. PB - JACoW Publishing CP - Geneva, Switzerland SP - 342 EP - 345 KW - cavity KW - FEL KW - experiment KW - electron KW - laser DA - 2019/01 PY - 2019 SN - 978-3-95450-201-1 DO - DOI: 10.18429/JACoW-IBIC2018-WEOA04 UR - http://jacow.org/ibic2018/papers/weoa04.pdf ER -