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RIS citation export for TUOA02: Application of Machine Learning to Beam Diagnostics

TY  - CONF
AU  - Fol, E.
AU  - Coello de Portugal, J.M.
AU  - Tomás, R.
ED  - Schaa, Volker RW
TI  - Application of Machine Learning to Beam Diagnostics
J2  - Proc. of IBIC2018, Shanghai, China, 09-13 September 2018
CY  - Shanghai, China
T2  - International Beam Instrumentation Conference
T3  - 7
LA  - english
AB  - Machine learning techniques are used in various scientific and industry fields as a powerful tool for data analysis and automatization. The presentation is devoted to exploration of relevant machine learning methods for beam diagnostics. The target is to provide an insight into modern machine learning techniques, which can be applied to improve current beam diagnostics and general applications in accelerators. Possible concepts for future applications are also presented.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 169
EP  - 176
KW  - network
KW  - optics
KW  - diagnostics
KW  - controls
KW  - simulation
DA  - 2019/01
PY  - 2019
SN  - 978-3-95450-201-1
DO  - DOI: 10.18429/JACoW-IBIC2018-TUOA02
UR  - http://jacow.org/ibic2018/papers/tuoa02.pdf
ER  -