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RIS citation export for WEBL04: The New Optical Device for Turn to Turn Beam Profile Measurement

TY - CONF
AU - Dorokhov, V.L.
AU - Khilchenko, A.D.
AU - Korchuganov, V.
AU - Kotelnikov, A.I.
AU - Kvashnin, A.N.
AU - Meshkov, O.I.
AU - Stirin, A.I.
AU - Valentinov, A.G.
AU - Zubarev, P.V.
ED - Schaa, Volker RW
TI - The New Optical Device for Turn to Turn Beam Profile Measurement
J2 - Proc. of IBIC2016, Barcelona, Spain, Sept. 13-18, 2016
C1 - Barcelona, Spain
T2 - International Beam Instrumentation Conference
T3 - 5
LA - english
AB - The electron beam quality determines the main synchrotron radiation characteristics therefore beam diagnostics is of great importance for synchrotron radiation source performance. The real-time processing of the electron beam parameters is a necessary procedure to optimize the key characteristics of the source using feedback loops. The frequency of electron beam cycling in the synchrotron storage ring is about 1 MHz. In multi-bunch mode electrons are grouped into a series of bunches. The bunch repetition frequency depends on the total number of bunches and usually reaches hundreds of MHz. The actual problem is to study the separate bunch dimensions behavior under multi-bunch beam instabilities. To solve this problem a turn-to-turn electron beam profile monitor is developed for Siberia-2 synchrotron light source. The linear avalanche photodiodes array is applied to imaging. The apparatus is able to record a transversal profile of selected bunches and analyze the dynamics of beam during 10⁶ turns. The recent experimental results obtained with the diagnostics are described.
PB - JACoW
CP - Geneva, Switzerland
SP - 594
EP - 597
KW - electron
KW - diagnostics
KW - storage-ring
KW - betatron
KW - positron
DA - 2017/02
PY - 2017
SN - 978-3-95450-177-9
DO - 10.18429/JACoW-IBIC2016-WEBL04
UR - http://jacow.org/ibic2016/papers/webl04.pdf
ER -