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TY - CONF AU - Revenko, R.V. AU - Vignet, J.L. ED - Schaa, Volker RW TI - Bunch Extension Monitor for LINAC of SPIRAL2 Project J2 - Proc. of IBIC2016, Barcelona, Spain, Sept. 13-18, 2016 C1 - Barcelona, Spain T2 - International Beam Instrumentation Conference T3 - 5 LA - english AB - A semi-interceptive monitor for bunch shape measure-ment has been developed for the LINAC of SPIRAL2. A Bunch Extension Monitor (BEM) is based on the registra-tion of X-rays emitted by the interaction of the beam ions with a thin tungsten wire. The time difference between detected X-rays and accelerating RF gives information about distribution of beam particles along the time axis. These monitors will be installed inside diagnostic boxes on the first five warm sections of the LINAC. The monitor consists of two parts: X-ray detector and mechanical system for positioning the tungsten wire into the beam. Emitted X-rays are registered by microchannel plates with fast readout. Signal processing is performed with constant fraction discriminators and TAC coupled with MCA. Results of bunch shape measurements obtained during commissioning of RFQ for SPIRAL2 are presented. PB - JACoW CP - Geneva, Switzerland SP - 487 EP - 491 KW - linac KW - ion KW - detector KW - positron KW - diagnostics DA - 2017/02 PY - 2017 SN - 978-3-95450-177-9 DO - 10.18429/JACoW-IBIC2016-TUPG59 UR - http://jacow.org/ibic2016/papers/tupg59.pdf ER -