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RIS citation export for MOPG70: Transverse Beam Profiling and Vertical Emittance Control with a Double-Slit Stellar Interferometer

TY - CONF
AU - Corbett, W.J.
AU - Huang, X.
AU - Li, C.L.
AU - Mitsuhashi, T.M.
AU - Wu, J.
AU - Xu, Y.H.
AU - Zhang, W.J.
ED - Schaa, Volker RW
TI - Transverse Beam Profiling and Vertical Emittance Control with a Double-Slit Stellar Interferometer
J2 - Proc. of IBIC2016, Barcelona, Spain, Sept. 13-18, 2016
C1 - Barcelona, Spain
T2 - International Beam Instrumentation Conference
T3 - 5
LA - english
AB - Double-slit interferometers are useful tools to measure the transverse the cross-section of relativistic charged particle beams emitting incoherent synchrotron radiation. By rotating the double-slit about the beam propagation axis, the transverse beam profile can be reconstructed including beam tilt at the source. The interferometer can also be used as a sensitive monitor for vertical emittance control. In this paper we outline a simple derivation of the Van Cittert-Zernike theorem, present results for a rotating double-slit measurement and demonstrate application of the interferometer to vertical emittance control using the Robust Conjugate Direction Search (RCDS) optimization algorithm.
PB - JACoW
CP - Geneva, Switzerland
SP - 237
EP - 240
KW - controls
KW - electron
KW - coupling
KW - optics
KW - radiation
DA - 2017/02
PY - 2017
SN - 978-3-95450-177-9
DO - 10.18429/JACoW-IBIC2016-MOPG70
UR - http://jacow.org/ibic2016/papers/mopg70.pdf
ER -