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TY - CONF AU - Griesmayer, E. AU - Bloomer, C. AU - Kavrigin, P. AU - Weiss, Ch. ED - Schaa, Volker RW TI - The Use of Single-crystal CVD Diamond as a Position Sensitive X-ray Detector J2 - Proc. of IBIC2016, Barcelona, Spain, Sept. 13-18, 2016 C1 - Barcelona, Spain T2 - International Beam Instrumentation Conference T3 - 5 LA - english AB - Synchrotron light sources generate intense beams of X-ray light for beamline experiments, and the stability of these X-ray beams has a large impact on the quality of the experiments that can be performed. User experiments increasingly utilise micro-focus techniques, focusing the X-ray beam size to below 10 microns at the sample point, with beamline detectors operating at kHz bandwidths. Thus, there is a demand for non-invasive diagnostic techniques that can reliably monitor the X-ray beam position with sub-micron accuracy in order to characterise X-ray beam motion, at corresponding kHz bandwidths. Reported in this paper are measurements from single-crystal CVD diamond detectors, and a comparison with the previous-generation of polycrystalline CVD diamond detectors is offered. Single-crystal diamond is shown to offer superior uniformity of response to incident X-rays, and excellent intensity and position sensitivity. Measurements from single-crystal diamond detectors installed at Diamond Light Source are presented, and their use in feedback routines in order to stabilise the X-ray beam at the sample point is discussed. PB - JACoW CP - Geneva, Switzerland SP - 71 EP - 74 KW - detector KW - synchrotron KW - photon KW - radiation KW - diagnostics DA - 2017/02 PY - 2017 SN - 978-3-95450-177-9 DO - 10.18429/JACoW-IBIC2016-MOPG14 UR - http://jacow.org/ibic2016/papers/mopg14.pdf ER -