Author: Planas, M.P.
Paper Title Page
WED03
Pulse Resolved Photon Diagnostics at MHz Repetition Rates  
 
  • J. Grünert, F. Dietrich, W. Freund, A. Koch, N.G. Kujala, J. Laksman, J. Liu, Th. Maltezopoulos, M.P. Planas
    EuXFEL, Schenefeld, Germany
 
  The European X-ray Free Electron Laser (EuXFEL) enables a new era in the research of ultrafast dynamics of microscopic structures with atomic resolution. First light was demonstrated in May 2017 and operation started with three undulator beamlines and six experimental endstations with a commissioning phase from 2017 till early 2019 [1]. The world-wide unique feature of this machine is the combination of immensely brilliant and ultrashort X-ray pulses with a repetition rate in the MHz range. However, this also requires novel photon diagnostics [2] to cope with these extreme conditions, to enable stable machine operation and to deliver beam diagnostic data to the users. In this contribution, we describe the results obtained in the commissioning and operation of the facility diagnostics capable of surviving exposure to multi-bunch operation and resolving the characteristics of individual pulses at MHz rates. In particular we employ for this task gas-ionization monitors, photoelectron spectroscopy of ionized noble gases, gated scintillator imaging, crystal spectrometers and arrival time monitors with fast line detectors, diamond detectors, and multi-channel plate based intensity monitors.
[1] T. Tschentscher et al., Appl. Sci. 7, 592 (2017).
[2] J. Gruenert et al., accepted for publication in J. Synchrotron Rad. (2019).
 
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