FEL2019 - List of Authors (Neuhaus, M.)

Paper	Title	Page
WEP003	Balanced Optical-Microwave Phase Detector for 800-nm Pulsed Lasers with Sub-Femtosecond Resolution	322
	K. Şafak, A. Berlin, E. Cano Vargas, H.P.H. Cheng, A. Dai, J. Derksen, M. Neuhaus, P. Schiepel Cycle GmbH, Hamburg, Germany F.X. Kärtner Deutsches Elektronen Synchrotron (DESY) and Center for Free Electron Science (CFEL), Hamburg, Germany
	Novel light-matter interaction experiments conducted in free-electron lasers, ultrafast electron diffraction instruments and extreme light infrastructures require synchronous operation of microwave sources with femtosecond pulsed lasers [1]. In particular, Ti:sapphire lasers have become the most common near-infrared light source used in these facilities due to their wide-range tunability and their ability to generate ultrashort pulses at around 800-nm optical wavelength [2]. Therefore, a highly sensitive optical-to-microwave phase detector operating at 800 nm is an indispensable tool to synchronize these ubiquitous lasers to the microwave clocks of these facilities. Electro-optic sampling is one approach that has proven to be the most precise in extracting the relative phase noise between microwaves and optical pulse trains. However, their implementation at 800-nm wavelength has been so far limited [3]. Here, we show a balanced optical-microwave phase detector designed for 800-nm operation based on electro-optic sampling. The detector has a timing resolution of 0.01 fs RMS for offset frequencies above 100 Hz and a total noise floor of less than 10 fs RMS integrated from 1 Hz to 1 MHz. [1] M. Xin, K. Shafak and F. X. Kärtner, Optica, vol. 5, no. 12, pp. 1564-1578, 2018. [2] H. Yang et al., Scientific Reports, vol. 7, no. 39966, 2017. [3] M. Titberidze, DESY-THESIS-2017-040, 2017.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-WEP003
About •	paper received ※ 20 August 2019 paper accepted ※ 27 August 2019 issue date ※ 05 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Balanced Optical-Microwave Phase Detector for 800-nm Pulsed Lasers with Sub-Femtosecond Resolution

322

K. Şafak, A. Berlin, E. Cano Vargas, H.P.H. Cheng, A. Dai, J. Derksen, M. Neuhaus, P. Schiepel
Cycle GmbH, Hamburg, Germany
F.X. Kärtner
Deutsches Elektronen Synchrotron (DESY) and Center for Free Electron Science (CFEL), Hamburg, Germany

Novel light-matter interaction experiments conducted in free-electron lasers, ultrafast electron diffraction instruments and extreme light infrastructures require synchronous operation of microwave sources with femtosecond pulsed lasers [1]. In particular, Ti:sapphire lasers have become the most common near-infrared light source used in these facilities due to their wide-range tunability and their ability to generate ultrashort pulses at around 800-nm optical wavelength [2]. Therefore, a highly sensitive optical-to-microwave phase detector operating at 800 nm is an indispensable tool to synchronize these ubiquitous lasers to the microwave clocks of these facilities. Electro-optic sampling is one approach that has proven to be the most precise in extracting the relative phase noise between microwaves and optical pulse trains. However, their implementation at 800-nm wavelength has been so far limited [3]. Here, we show a balanced optical-microwave phase detector designed for 800-nm operation based on electro-optic sampling. The detector has a timing resolution of 0.01 fs RMS for offset frequencies above 100 Hz and a total noise floor of less than 10 fs RMS integrated from 1 Hz to 1 MHz.
[1] M. Xin, K. Shafak and F. X. Kärtner, Optica, vol. 5, no. 12, pp. 1564-1578, 2018.
[2] H. Yang et al., Scientific Reports, vol. 7, no. 39966, 2017.
[3] M. Titberidze, DESY-THESIS-2017-040, 2017.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-WEP003

About •

paper received ※ 20 August 2019 paper accepted ※ 27 August 2019 issue date ※ 05 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)