Author: Lu, W.
Paper Title Page
WEP079 Effect of Heat Load on Cryo-Cooled Monochromators at the European X-Ray Free-Electron Laser: Simulations and First Experimental Observations 502
 
  • I. Petrov, U. Boesenberg, M. Dommach, J. Eidam, J. Hallmann, K. Kazarian, C. Kim, W. Lu, A. Madsen, J. Möller, M. Reiser, L. Samoylova, R. Shayduk, H. Sinn, V. Sleziona, A. Zozulya
    EuXFEL, Schenefeld, Germany
  • J.W.J. Anton, S.P. Kearney, D. Shu
    ANL, Lemont, Illinois, USA
  • X. Dong
    SINAP, Shanghai, People’s Republic of China
  • X. Dong
    SARI-CAS, Pudong, Shanghai, People’s Republic of China
 
  European XFEL (EuXFEL) generates high-intensity ultra-short pulses at MHz repetition rate. At hard X-ray instruments, cryo-cooled silicon monochromators are used to reduce pulse bandwidth. Here, first experimental observations during commissioning of a cryo-cooled monochromator at Materials Imaging and Dynamics (MID) instrument are presented and compared with heat flow simulations. A thermal relaxation time is estimated and compared with arrival time interval between pulses. This provides the repetition rate tolerable for stable operation of monochromator.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-WEP079  
About • paper received ※ 19 August 2019       paper accepted ※ 25 August 2019       issue date ※ 05 November 2019  
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