Author: Laksman, J.
Paper Title Page
TUA04 Harmonic Lasing Experiment at the European XFEL 29
 
  • E. Schneidmiller, F. Brinker, W. Decking, M.W. Guetg, S. Liu, D. Nölle, M. Scholz, M.V. Yurkov, I. Zagorodnov
    DESY, Hamburg, Germany
  • G. Geloni, N. Gerasimova, J. Grünert, S. Karabekyan, N.G. Kujala, J. Laksman, Y. Li, J. Liu, Th. Maltezopoulos, I. Petrov, L. Samoylova, S. Serkez, H. Sinn, F. Wolff-Fabris
    EuXFEL, Hamburg, Germany
  
  Harmonic lasing is an opportunity to extend the photon energy range of existing and planned X-ray FEL user facilities. Contrary to nonlinear harmonic generation, harmonic lasing can provide a much more intense, stable, and narrow-band FEL beam. Another interesting application is Harmonic Lasing Self-Seeding (HLSS) that allows to improve the longitudinal coherence and spectral power of a Self-Amplified Spontaneous Emission (SASE) FEL. This concept was successfully tested at FLASH in the range of 4.5 - 15 nm and at PAL XFEL at 1 nm. In this contribution we present recent results from the European XFEL where we successfully demonstrated operation of HLSS FEL at 5.9 Angstrom and 2.8 Angstrom, in the latter case obtaining both 3rd and 5th harmonic lasing.  
slides icon Slides TUA04 [1.174 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-TUA04  
About • paper received ※ 20 August 2019       paper accepted ※ 29 August 2019       issue date ※ 05 November 2019  
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TUP062 Two Colors at the SASE3 Line of the European XFEL: Project Scope and First Measurements 195
 
  • S. Serkez, G. Geloni, N. Gerasimova, J. Grünert, S. Karabekyan, A. Koch, J. Laksman, Th. Maltezopoulos, T. Mazza, M. Meyer, S. Tomin
    EuXFEL, Hamburg, Germany
  • W. Decking, L. Fröhlich, V. Kocharyan, Y.A. Kot, E. Saldin, E. Schneidmiller, M. Scholz, M.V. Yurkov, I. Zagorodnov
    DESY, Hamburg, Germany
  • M. Huttula
    University of Oulu, Oulu, Finland
  • E. Kukk
    University of Turku, Turku, Finland
  
  The European XFEL is a high-repetition rate facility that generates high-power SASE radiation pulses in three beamlines. A joint upgrade project, with Finnish universities, to equip the SASE3 beamline with a chicane has been recently approved to generate two SASE pulses with different photon energies and temporal separation. In this work we report the status of the project, its expected performance, and recent experimental results. Additionally, we discuss methods to diagnose the properties of the generated radiation.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-TUP062  
About • paper received ※ 20 August 2019       paper accepted ※ 29 August 2019       issue date ※ 05 November 2019  
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WED03
 Pulse Resolved Photon Diagnostics at MHz Repetition Rates  
 
  • J. Grünert, F. Dietrich, W. Freund, A. Koch, N.G. Kujala, J. Laksman, J. Liu, Th. Maltezopoulos, M.P. Planas
    EuXFEL, Schenefeld, Germany
  
  The European X-ray Free Electron Laser (EuXFEL) enables a new era in the research of ultrafast dynamics of microscopic structures with atomic resolution. First light was demonstrated in May 2017 and operation started with three undulator beamlines and six experimental endstations with a commissioning phase from 2017 till early 2019 [1]. The world-wide unique feature of this machine is the combination of immensely brilliant and ultrashort X-ray pulses with a repetition rate in the MHz range. However, this also requires novel photon diagnostics [2] to cope with these extreme conditions, to enable stable machine operation and to deliver beam diagnostic data to the users. In this contribution, we describe the results obtained in the commissioning and operation of the facility diagnostics capable of surviving exposure to multi-bunch operation and resolving the characteristics of individual pulses at MHz rates. In particular we employ for this task gas-ionization monitors, photoelectron spectroscopy of ionized noble gases, gated scintillator imaging, crystal spectrometers and arrival time monitors with fast line detectors, diamond detectors, and multi-channel plate based intensity monitors.
[1] T. Tschentscher et al., Appl. Sci. 7, 592 (2017).
[2] J. Gruenert et al., accepted for publication in J. Synchrotron Rad. (2019). 		 
slides icon Slides WED03 [4.921 MB]  
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