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RIS citation export for THB03: Emittance Measurements and Minimization at SwissFEL

TY  - UNPB
AU  - Prat, E.
AU  - Aiba, M.
AU  - Bettoni, S.
AU  - Craievich, P.
AU  - Dijkstal, P.
AU  - Ferrari, E.
AU  - Ischebeck, R.
AU  - Löhl, F.
AU  - Malyzhenkov, A.
AU  - Orlandi, G.L.
AU  - Reiche, S.
AU  - Schietinger, T.
ED  - Schaa, Volker R.W.
ED  - Decking, Winfried
ED  - Sinn, Harald
ED  - Geloni, Gianluca
ED  - Schreiber, Siegfried
ED  - Marx, Michaela
TI  - Emittance Measurements and Minimization at SwissFEL
J2  - Proc. of FEL2019, Hamburg, Germany, 26-30 August 2019
CY  - Hamburg, Germany
T2  - Free Electron Laser Conference
T3  - 39
LA  - english
AB  - The transverse emittance of the electron beam is a fundamental parameter that determines the performance of free-electron-lasers (FELs). In this contribution, we present emittance measurements carried out at SwissFEL, the X-ray FEL facility that recently started to operate at PSI in Switzerland, including a description of our measurement methods and optimization procedures. We obtained slice emittance values at the undulator entrance down to ~200 nm for an electron beam with a charge of 200 pC and an r.m.s. duration of ~30 fs. Furthermore, we achieved slice emittances as low as ~100 nm for 10 pC beams with few femtosecond duration.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
ER  -