Author: Sleziona, V.
Paper Title Page
TUC02 Thermal and Mechanical Stability of Bragg Reflectors under Pulsed XFEL Radiation 240
 
  • I. Bahns, C.P. Maag, J. Roßbach, P. Thiessen
    University of Hamburg, Institut für Experimentalphysik, Hamburg, Germany
  • H. Sinn, V. Sleziona
    XFEL. EU, Hamburg, Germany
  • J. Zemella
    DESY, Hamburg, Germany
 
  Funding: BMBF FKZ 05K16GU4
Free-electron laser(FEL) x-ray radiation can deliver pulses with a huge amount of energy in short time duration. X-ray optics like Bragg reflectors therefore must be chosen in a way that they can withstand radiation-material interaction without getting damaged so that they can maintain their technical functionality. Therefore thermal and mechanical reactions of Bragg reflectors to the radiation induced thermal strain and force (radiation pressure) have been considered in this study. The theory of thermoelasticity has been used to simulate the strain conditions at saturation of the amplifying process in an X-ray free-electron laser oscillator(XFELO). One aim of this study was to investigate, if the radiation pressure could be an effect that gives a considerable contribution to the strain propagation. The results of the simulations have shown that, if Bragg backscattering of the X-ray pulse by a diamond crystal with 99% reflectivity and 1% absorptivity is assumed, the value of the thermally induced strain is about two magnitudes higher than the radiation pressure induced strain.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2017-TUC02  
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