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RIS citation export for MOC01: 0.1-nm FEL Lasing of PAL-XFEL

TY - UNPB
AU - Kang, H.-S.
AU - Heo, H.
AU - Kim, C.
AU - Kim, G.
AU - Min, C.-K.
AU - Yang, H.
ED - Bishofberger, Kip:Carlsten, Bruce (LANL, Los Alamos, NM, USA)[ORCID:0000-0001-5619-907X]
ED - Schaa, Volker RW
TI - 0.1-nm FEL Lasing of PAL-XFEL
J2 - Proc. of FEL2017, Santa Fe, NM, USA, August 20-25, 2017
C1 - Santa Fe, NM, USA
T2 - International Free Electron Laser Conference
T3 - 38
LA - english
AB - The hard X-ray free electron laser at Pohang Accelerator Laboratory (PAL-XFEL) achieved saturation of a 0.144-nm free electron laser (FEL) beam on November 27, 2016, making it the third hard X-ray FEL in the world, following LCLS in 2009 and SACLA in 2011. On February 2, 2017, a saturated 1.52-nm FEL beam was also achieved in the soft X-ray FEL line with an electron beam energy of 3.0 GeV. Finally, saturation of a 0.104-nm FEL beam was achieved on March 16, 2017 using an electron beam energy of 9.47 GeV and K = 1.87. In this paper we present the commissioning result of PAL-XFEL as well as the beamline commissioning results.
PB - JACoW
CP - Geneva, Switzerland
ER -