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https://doi.org/10.18429/JACoW-FEL2017-TUP016
Title Beam-Dynamics Analysis of Long-Range Wakefield Effects on the SCRF Cavities at the Fast Facility
Authors
  • Y.-M. Shin
    Northern Illinois University, DeKalb, Illinois, USA
  • K. Bishofberger, B.E. Carlsten, F.L. Krawczyk
    LANL, Los Alamos, New Mexico, USA
  • A.H. Lumpkinpresenter, J. Ruan, R.M. Thurman-Keup
    Fermilab, Batavia, Illinois, USA
Abstract Long-range wakefields in superconducting RF (SCRF) cavities create complicated effects on beam dynamics in SCRF-based FEL beamlines. The driving bunch excites effectively an infinite number of structure modes (including HOMs) which oscillate within the SCRF cavity. Couplers with loads are used to damp the HOMs. However, these HOMs can persist for long periods of time in superconducting structures, which leads to long-range wakefields. Clear understanding of the long-range wakefield effects is a critical element for risk mitigation of future SCRF accelerators such as XFEL at DESY, LCLS-II XFEL, and MaRIE XFEL. We are currently developing numerical tools for simulating long-range wakefields in SCRF accelerators and plan to experimentally verify the tools by measuring these wakefields at the Fermilab Accelerator Science and Technology (FAST) facility. This paper previews the experimental conditions at the FAST 50 MeV beamline based on the simulation results.
Funding Work supported by the subcontract (contract No: G2A62653) of LANL-LDRD program and DOE contract No. DEAC02-07CH11359 to the Fermi Research Alliance LLC.
Paper download TUP016.PDF [1.108 MB / 4 pages]
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Conference FEL2017, Santa Fe, NM, USA
Series International Free Electron Laser Conference (38th)
Proceedings Link to full FEL2017 Proccedings
Session Poster II
Date 22-Aug-17   15:30–17:30
Main Classification Electron Beam Dynamics
Keywords ion, cavity, wakefield, HOM, simulation
Publisher JACoW, Geneva, Switzerland
Editors Kip Bishofberger (LANL, Los Alamos, NM, USA); Bruce Carlsten (LANL, Los Alamos, NM, USA); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-179-3
Published February 2018
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