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https://doi.org/10.18429/JACoW-FEL2017-TUC02
Title Thermal and Mechanical Stability of Bragg Reflectors under Pulsed XFEL Radiation
Authors
  • I. Bahns, C.P. Maag, J. Roßbach, P. Thiessen
    University of Hamburg, Institut für Experimentalphysik, Hamburg, Germany
  • H. Sinn, V. Sleziona
    XFEL. EU, Hamburg, Germany
  • J. Zemella
    DESY, Hamburg, Germany
Abstract Free-elec­tron laser(FEL) x-ray ra­di­a­tion can de­liver pulses with a huge amount of en­ergy in short time du­ra­tion. X-ray op­tics like Bragg re­flec­tors there­fore must be cho­sen in a way that they can with­stand ra­di­a­tion-ma­te­r­ial in­ter­ac­tion with­out get­ting dam­aged so that they can main­tain their tech­ni­cal func­tion­al­ity. There­fore ther­mal and me­chan­i­cal re­ac­tions of Bragg re­flec­tors to the ra­di­a­tion in­duced ther­mal strain and force (ra­di­a­tion pres­sure) have been con­sid­ered in this study. The the­ory of ther­mo­elas­tic­ity has been used to sim­u­late the strain con­di­tions at sat­u­ra­tion of the am­pli­fy­ing process in an X-ray free-elec­tron laser os­cil­la­tor(XFELO). One aim of this study was to in­ves­ti­gate, if the ra­di­a­tion pres­sure could be an ef­fect that gives a con­sid­er­able con­tri­bu­tion to the strain prop­a­ga­tion. The re­sults of the sim­u­la­tions have shown that, if Bragg backscat­ter­ing of the X-ray pulse by a di­a­mond crys­tal with 99% re­flec­tiv­ity and 1% ab­sorp­tiv­ity is as­sumed, the value of the ther­mally in­duced strain is about two mag­ni­tudes higher than the ra­di­a­tion pres­sure in­duced strain.
Funding BMBF FKZ 05K16GU4
Paper download TUC02.PDF [0.552 MB / 4 pages]
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Conference FEL2017, Santa Fe, NM, USA
Series International Free Electron Laser Conference (38th)
Proceedings Link to full FEL2017 Proccedings
Session FEL Oscillators
Date 22-Aug-17   13:30–15:00
Main Classification FEL Oscillators
Keywords ion, radiation, FEL, laser, photon
Publisher JACoW, Geneva, Switzerland
Editors Kip Bishofberger (LANL, Los Alamos, NM, USA); Bruce Carlsten (LANL, Los Alamos, NM, USA); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-179-3
Published February 2018
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