MSUdownload RIS dataset for institute's DOIs
East Lansing, Michigan, USA
| DOI | Title |
|---|---|
| 10.18429/JACoW-ECRIS2020-MOYZO03 | The Relationship Between the Diffusion of Hot Electrons, Plasma Stability, and ECR Ion Source Performance |
| 10.18429/JACoW-ECRIS2020-MOZZO06 | Microcontrollers as Gate and Delay Generators for Time Resolved Measurements |