Author: Mazzaglia, M.
Paper Title Page
MOYZO01 Imaging in X-ray Ranges to Locally Investigate the Effect of the Two-Close-Frequency Heating in ECRIS Plasmas 27
 
  • R. Rácz, S. Biri, Z. Perduk
    Atomki, Debrecen, Hungary
  • G. Castro, L. Celona, S. Gammino, D. Mascali, M. Mazzaglia, E. Naselli, G. Torrisi
    INFN/LNS, Catania, Italy
  • A. Galatà
    INFN/LNL, Legnaro (PD), Italy
  • E. Naselli
    Catania University, Catania, Italy
  • J. Pálinkás
    University Debrecen, Debrecen, Hungary
 
  Plasma instabilities limit the ECR Ion Sources performances in terms of flux of the extracted highly charged ions by causing beam ripple and unstable operation conditions. In a 14 GHz ECRIS (Atomki, Debrecen), the effect on the plasma instabilities in an Argon plasma at Two Close Frequencies heating scheme (the frequency gap is smaller than 1 GHz) has been explored. A special multi-diagnostic setup [1, 2] has been designed and implemented consisting of detectors for the simultaneous collection of plasma radio-self-emission and of high spatial resolution X-ray images in the 500 eV - 20 keV energy domain (using an X-ray pin-hole camera setup). We present the comparison of plasma structural changes as observed from X-ray images in single and double-frequency operations. The latter has been particularly correlated to the confinement and velocity anisotropy, also by considering results coming from numerical simulations.
[1] S. Biri et al. Journal of Instrumentation 13(11):C11016 DOI: 10.1088/1748-0221/13/11/C11016
[2] E. Naselli et. al. Journal of Instrumentation 14(10):C10008 DOI: 10.1088/1748-0221/14/10/C10008
 
slides icon Slides MOYZO01 [7.325 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2020-MOYZO01  
About • Received ※ 25 September 2020 — Revised ※ 11 November 2020 — Accepted ※ 17 December 2020 — Issue date ※ 24 January 2021
Cite • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)  
 
MOYZO02 High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics 32
 
  • E. Naselli, G. Castro, L. Celona, S. Gammino, D. Mascali, M. Mazzaglia, G. Torrisi
    INFN/LNS, Catania, Italy
  • S. Biri, Z. Perduk, R. Rácz
    Atomki, Debrecen, Hungary
  • A. Galatà
    INFN/LNL, Legnaro (PD), Italy
  • E. Naselli
    Catania University, Catania, Italy
  • J. Pálinkás
    DU, Debrecen, Hungary
 
  High resolution spatially-resolved X-ray spectroscopy, by means of a X-ray pin-hole camera setup* ** operating in the 0.5-20 keV energy domain, is a very powerful method for ECRIS plasma structure evaluation. We present the setup installed at a 14 GHz ECRIS (ATOMKI, Debrecen), including a multi-layered collimator enabling measurements up to several hundreds of watts of RF pumping power and the achieved spatial and energy resolution (0.5 mm and 300 eV). Results coming by a new algorithm for analyzing Integrated (multi-events detection) and Photon-Counted images (single-event detection) to perform energy-resolved investigation will be described. The analysis permits to investigate High-Dynamic-Range (HDR) and spectrally resolved images, to study the effect of the axial and radial confinement (even separately), the plasma radius, the fluxes of deconfined electrons distinguishing fluorescence lines of the materials of the plasma chamber (Ti, Ta) from plasma (Ar) fluorescence lines. This method allows a detailed characterization of warm electrons, important for ionization, and to quantitatively estimate local plasma density and spectral temperature pixel-by-pixel.
*S. Biri et al., JINST 13(11):C11016-C11016, DOI:10.1088/1748-0221/13/11/C11016
**E. Naselli et al., JINST 14(10):C10008-C10008, DOI:10.1088/1748-0221/14/10/C10008
 
slides icon Slides MOYZO02 [26.629 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2020-MOYZO02  
About • Received ※ 27 September 2020 — Revised ※ 02 October 2020 — Accepted ※ 18 November 2020 — Issue date ※ 17 December 2020
Cite • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)