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BiBTeX citation export for WEWZO04: Producing Multicharged Ions by Pulse Modulated Microwaves at Mixing Low Z Gases on ECRIS

@inproceedings{harisaki:ecris2020-wewzo04,
  author       = {S. Harisaki and Y. Kato and W. Kubo and I. Owada and K. Sato and K. Tsuda},
  title        = {{Producing Multicharged Ions by Pulse Modulated Microwaves at Mixing Low Z Gases on ECRIS}},
  booktitle    = {Proc. ECRIS'20},
% booktitle    = {Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20)},
  pages        = {122--124},
  eid          = {WEWZO04},
  language     = {english},
  keywords     = {experiment, ECR, resonance, plasma, cyclotron},
  venue        = {East Lansing, MI, USA},
  series       = {International Workshop on ECR Ion Sources},
  number       = {24},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {07},
  year         = {2022},
  issn         = {2222-5692},
  isbn         = {978-3-95450-226-4},
  doi          = {10.18429/JACoW-ECRIS2020-WEWZO04},
  url          = {https://jacow.org/ecris2020/papers/wewzo04.pdf},
  abstract     = {{We are aiming at producing various ion beams in ECRIS. In the case of producing multicharged ion beams, we try to enhance loss channel of low Z ions by means of adding pulse modulated microwaves to conventional gas mixing method.* Through these experiments, we explore the feasibility of selectively heating specific ions with pulse modulated microwaves and launching another low frequency RF waves. In gas mixing experiment, we use Helium as low Z gas for production of multicharged Ar and Xenon ion beams. These experiments are conducted by keeping the total pressure constant and changing the mixing ratio of Helium. The time scale of pulsed microwave is typically several to several hundreds of microseconds. We optimize the pulse period and duty ratio for producing multicharged ion beams. These effects are investigated to measure Charge State Distributions (CSDs). Also, we can measure the emittance using wire probe and multi slit attached to Ion Beam Irradiation System (IBIS). ** We estimate the normalized emittance from this measurement to determine index of ion temperature in the ECRIS. In this paper, we mainly describe the results of these active and additive methods at the ECRIS.}},
}