Polarimetry of hard X-rays emitted through interactions between highly charged heavy ions and electrons is important. In particular, polarized hard X-rays emitted from high-Z ions are of significant importance in evaluating relativistic and quantum-electrodynamics interactions such as the Breit interaction. A new polarimetric method has been needed so far to achieve high sensitivity and accuracy for hard X-ray polarimetry. Recently, novel Compton polarimeters, called silicon (Si) / cadmium telluride (CdTe) Compton cameras, have proven powerful for observations of celestial X-ray and gamma-ray objects. We applied a Si/CdTe Compton camera for the polarimetry of hard X-rays from highly charged ions and evaluated its polarimetric performance. A series of experiments were conducted to measure the degree of polarization of X-rays emitted through radiative recombination of highly charged krypton ions. The uncertainty of the result is sufficiently small to probe effect of the Breit interaction on X-ray polarization.