Chung Moses
FR4WH02
Highly charged argon ion spectroscopy experiment at PAL-XFEL with the UNIST-EBIT
Visible matters exist mostly in highly charged states. To analyze those, CHEA (Centre for High Energy Astrophysics) built an Electron Beam Ion Trap (EBIT) to acquire spectral data of individual elements in their highly charged states. Preliminary experiments on connecting the EBIT with the PAL-XFEL have been conducted over the two R&D beam times. During these shifts, we study the highly charged argon with the aid of a monochromatic photon beam from the PAL-XFEL (Pohang Accelerator Laboratory X-ray Free Electron Laser). In this work, we demonstrate argon spectroscopic measurements as well as preparation for our final target experiments with iron.
  • S. Park
    Ulsan National Institute of Science and Technology
  • B. Shin
    Pohang Accelerator Laboratory
  • M. Chung
    Pohang University of Science and Technology
Slides: FR4WH02
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FR4WH03
Offline test of EBIS charge breeder for RAON facility using Cs1+ ion beam
The heavy-ion accelerator RAON is being developed by the Rare Isotope Science Project (RISP) in the Institute for Basic Science (IBS) of Korea for basic science research through experiments with rare-isotope (RI) beams. Various RI beams are transported from the Isotope Separation On-Line (ISOL) beamline, and they are accelerated in the superconducting post-accelerator. The energy requirement of the RI beams for the post-accelerator is 10 keV/u, and their charge state must be adjusted to facilitate the acceleration. The Electron Beam Ion Source (EBIS) charge breeder is installed before the post-accelerator to match the mass-to-charge ratio (A/q) of the RI beams to the accelerator condition. A singly charged ion beam is trapped in the EBIS and interacts with the compressed electron beam in a strong magnetic field. The electron beam removes electrons of the ion beam by collision and produces highly charged ions. A Cs test ion source is used for the offline test of the EBIS charge breeder, and the results will be described in this presentation.
  • K. Yoo, J. Lee, S. Heo, Y. Park
    Institute for Basic Science
  • C. Lim
    Korea University Sejong Campus
  • M. Chung
    Pohang University of Science and Technology
Slides: FR4WH03
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