The ReA post-accelerator of the Facility for Rare Isotope Beams (FRIB) employs an Electron-Beam Ion Trap (EBIT) as a charge breeder to reaccelerate RIB up ~10 MeV/u. The ReA-EBIT uses a Pierce-type electron gun, partially magneto-immersed with a Ba-dispenser cathode, to produce an electron current of ~600 mA. It corresponds to a current density of ~340 A/cm^2 in the ion trap and a trap capacity of 10^10 charges, which can be insufficient to handle future high RIB rates. To increase the trap capacity, a High-Current Electron-Beam Ion Source (HCEBIS) has been built based on the TestEBIS obtained from BNL. By using a 4-A electron beam launched from a LaB6 convex cathode immersed in a magnetic field, a current density of 298 A/cm^2 and a maximum capacity of 2.4×10^11 charges are predicted. In parallel, the ReA-EBIT e-gun is being upgraded. A new insert is being fabricated to include a large-area dispenser cathode to achieve higher electron-beam current and density. A 2-A electron-beam is projected to reach a capacity of 5×10^10 charges. In simulations a current density of 432 A/cm^2 was obtained in the trap region. This paper presents the status of the HCEBIS and the ReA-EBIT upgrade.

The Extended EBIS will provide 2.1E9 Au32+/pulse at the Booster ring entrance, a 40-50% intensity upgrade compared with the existing RhicEBIS at BNL. The axial magnetic field for an extended ion trap is achieved by using two closely coupled 5T superconducting solenoids. Initial operation will also provide beams of He2+ and H+ from gas injection. With a future upgrade, beams of 3He2+ with intensity up to 2.5E11 ions per pulse and 70% polarization will be produced for the future Electron Ion Collider. Electron and ion beam tests were made using a novel external drift tube structure and gas injection module. 8A, 5ms and 5A, 100ms e-beams have been propagated. A fast pulsed valve and gas handing system, installed within the magnetic field of the first solenoid, was used to transfer ions to the downstream ion trap regions, with subsequent extraction of ions from the EBIS. The final configuration of the Extended EBIS drift tube structure and vacuum system has been installed and testing is in progress. External ion injection and ion extraction tests will be made after the Extended EBIS is installed using existing RHIC beam lines at the accelerator location.

The Extended EBIS is currently going through final development and offline testing and will replace RHIC EBIS as a main ion injector for both RHIC and NASA Space Radiation Laboratory in the beginning of 2023. Due to its longer ion trap, the Extended EBIS will enhance the maximum available beam intensity of Au32+ions by 40 - 50% compared to RHIC EBIS. With a further upgrade, the Extended EBIS will also produce polarized 3He2+ ions for the future electron-ion collider. Two attractive options for external ion sources of singly charged ions which can significantly improve the operational flexibility and stability of Extended EBIS are a picosecond laser ion source and a cluster ion source. A laser with high rep-rate can produce quasi continuous singly charged ion beams from elements of solid targets for periods of tens of milliseconds, making it possible to take advantage of the ability of the EBIS to trap singly charged ions in accumulation injection mode. For most of gaseous elements, a source of cluster ions is quite an attractive option. Cluster ion beams have multiple advantages for external injection into EBIS trap in comparison with atomic ion beams.

The ExtendedEBIS upgrade is being developed at Brookhaven National Laboratory to replace RhicEBIS. ExtendedEBIS consists of two series solenoids to allow increased trap length and to accommodate an internal gas injection system in the upstream solenoid. An insertable electron beam detector is installed between the solenoids. The detector comprises two sets of quadrant plates placed on either side of a base plate. Each set of the quadrants has an (8.5 mm) aperture, larger than the beam diameter (4.5 mm) at that location. By comparing the 4 signals from any intercepted losses on the cathode facing side, the pulsed electron beam position can be monitored. Therefore, one can continuously adjust the electron beam radial position at the axial midplane of Extended EBIS system without stopping the beam. The detector is useful for the beam alignment during commissioning and for checking the transverse beam steering system during operations. The set of the quadrants on the collector facing side is used to measure the electrons back-streaming from the collector or collector suppressor electrodes. During this presentation, the detector design and electron beam test results will be discussed.