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- J. W. Flanagan, H. Fukuma, S. Hiramatsu, H. Ikeda, K.-I. Kanazawa, T. Mitsuhashi, J. Urakawa
KEK, Ibaraki
- J. P. Alexander
CLASSE, Ithaca
- M. A. Palmer
Cornell University, Laboratory for Elementary-Particle Physics, Ithaca, New York
- G. S. Varner
UH, Honolulu, HI
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We present here design considerations for an x-ray monitor for high-resolution (a few um) and fast response (sub-nanosecond) for beam profile measurements to be used at an upgraded KEKB and/or ILC damping ring. The optics for the monitor are based on a technique borrowed from x-ray astronomy, coded-aperture imaging, which should permit broad-spectrum, low-distortion measurements to maximize the observable photon flux per bunch. Coupled with a high-speed digitizer system, the goal is to make sub-bunch-length, turn-by-turn measurements of beam profile and position.
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