A   B   C   D   E   F   G   H   I   J   K   L   M   N   O   P   Q   R   S   T   U   V   W   X   Y   Z  

Inoue, S. I.

Paper Title Page
TUPC075 Development Status of a Beam Diagnostic System with a Spatial Resolution of Ten Micron-meters for XFEL 1224
 
  • Y. Otake
    RIKEN Spring-8 Harima, Hyogo
  • H. Ego, H. Tomizawa, K. Yanagida
    JASRI/SPring-8, Hyogo-ken
  • A. Higashiya, S. I. Inoue, H. Maesaka, T. Shintake, M. Yabashi
    RIKEN/SPring-8, Hyogo
 
  Aroud 10 micron-meter stability of an electron beam is required along the undulator section of XFEL to stably generate an X ray laser, and comparable resolution is also required for beam position and size measurements. At SPring-8, the construction of an 8 GeV linac with undulators is now in progress to realize the X ray laser driven by such highly qualified electron beams. To obtain these beams, measurements of the spatial and temporal beam structures are very important. We are developing a beam diagnostic system with a measurement resolution of less than 10 micron-meters. The system comprises a cavity type beam position monitor, an optical transition radiation profile monitor, a beam current monitor, an rf beam deflector to diagnose femto-second order temporal structure, and beam slits to shape appropriately beam spatial structure. The arrangement of these instruments were decided by requirements of the beam position and size measurements based on beam optics design. This paper describes the development status of the beam diagnostic system. The test results and design of the instruments showed sufficient performance to realize the above mentioned measurement resolution.  
WEOAM01 Operation Status of the SCSS Test Accelerator: Continuous Saturation of SASE FEL at the Wavelength Range from ~50 to 60 nanometers 1944
 
  • H. Tanaka, T. Fukui, T. Hara, A. Higashiya, N. Hosoda, T. Inagaki, S. I. Inoue, T. Ishikawa, H. Kitamura, M. K. Kitamura, H. Maesaka, M. Nagasono, T. Ohshima, Y. Otake, T. Sakurai, T. Shintake, K. Shirasawa, T. Tanaka, K. Togawa, M. Yabashi
    RIKEN/SPring-8, Hyogo
  • T. Asaka, T. Hasegawa, H. Ohashi, S. Takahashi, S. Tanaka
    JASRI/SPring-8, Hyogo-ken
  • T. Tanikawa
    RIKEN Spring-8 Harima, Hyogo
 
  The SPring-8 compact SASE source (SCSS) test accelerator for XFEL/SPring-8 was constructed in 2005. The first lasing at 49 nm, though not reached saturation, was observed with the 250-MeV electron beam in June 2006. Towards the saturation, we started stabilizing the RF system in the injector section, which dramatically stabilized the lasing condition. The stable operation enables us to tune each of the machine parameter precisely by using the lasing response. The second undulator, which did not sufficiently contribute to the first lasing because of large multipole field errors, was replaced by new one. These improvements led us to the successful observation of SASE saturation at the wavelength ranging from ~50 to 60 nm in September 2007. A pulse-energy of 30 uJ is routinely obtained at 60 nm. Analysis of the obtained SASE saturation data with a 3D-FEL simulation code, SIMPLEX, suggests that the electron beam emittance is almost unchanged through the bunch compression process. The stable and intense EUV SASE FEL has been offered for user experiments since October 2007. The achieved electron beam performance, lasing property as well as the latest analysis result will be presented.  
slides icon Slides