| Paper |
Title |
Page |
| TUPC009 |
Vertical Beam Profile Measurement and Analysis with X-ray Pinhole
|
1059 |
| |
- M. J. Boland, M. J. Spencer
ASP, Clayton, Victoria
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Imaging the electron beam profile at a synchrotron light source is commonly performed in the x-ray regime using a pinhole camera system. However, with machines pushing down the vertical emittance, including errors in source point optical parameters, pinhole manufacturing limitations and error analysis difficulties associated with diffraction and image capture, the pinhole imaging system has large errors, up to 50% for an emittance of a few picometre. An analysis has been done at the Australian Synchrotron (AS) looking at the effects of errors in determining the x-ray pinhole source point parameters.
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| TUPC010 |
Single Bunch Studies at the Australian Synchrotron
|
1062 |
| |
- R. T. Dowd, M. J. Boland, G. LeBlanc, M. J. Spencer, Y. E. Tan
ASP, Clayton, Victoria
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| |
Studies using a single high charge electron bunch have been conducted at the Australian Synchrotron to characterise the impedance of the machine at various stages of commissioning and insertion device configuration. This paper will present the results of these studies and show the time evolution of machine impedance with increasing number of insertion devices.
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