| Paper | Title | Page |
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| MOPCH036 | Photocathode Roughness Impact on Photogun Beam Characteristics | 121 |
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| Photocathode surface roughness has an impact on photoelectron yield, bunch duration, beam emittance at the exit of femtosecond photogun with an accelerating field that is considered in assumption of quasi-stationary one in the paper. The main problem in investigating the impact is determination of the field near the surface, statistical properties of which are defined through rms values of deviation and slope in profile line of the surface roughness. Developed and created code allows determining the field with relative rms error not worse than 0.001%. The results of the investigation for rms values of roughness and its slope within respectively 500…0 nm and 20…0 degrees are presented and discussed. | ||
| TUPCH072 | New Generation Streak Camera Design and Investigation | 1175 |
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The only method for electron bunch duration monitoring with a resolution in the order of 10 fs and less is the method of photochronography of the bunch incoherent radiation in the frequency range, for example, of visible light and at realizing streak camera with new principles of its operation*. In the paper the streak camera design for measuring both the electron bunches and x-ray pulses duration with the mentioned temporal resolution is presented. The results of the camera investigation, with photoelectron dynamics simulation taking into account space-charge effect and impact of the surface roughness of a spherical photocathode of the 20-50 micrometers radius (forming a modulating gap of spherical configuration) on the camera resolution, are presented and discussed.
*A. M. Tron and I. G. Merinov. Method of bunch radiation photochronography with 10 femtosecond and less resolution. http://www.physics.ucla.edu/PAHBEB2005/talks/10oct2005/wg2/atron.pdf |