SRF2015 - List of Authors (Xu, H.)

Paper	Title	Page
TUPB046	Structure and Composition of Nb3Sn Diffusion Coated Films on Nb	669
	J. Tuggle, M.J. Kelley Virginia Polytechnic Institute and State University, Blacksburg, USA G.V. Eremeev, M.J. Kelley, C.E. Reece JLab, Newport News, Virginia, USA M.J. Kelley, H. Xu The College of William and Mary, Williamsburg, Virginia, USA
	Funding: Co-authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. College of William & Mary supported by U.S. DOE Office of High Energy Physics under grant DE-SC-0014475 The structure and composition of Nb3Sn films obtained by diffusion coating niobium coupons and SRF cavities were investigated by x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS) and scanning electron microscopy (SEM) with energy-dispersive x-ray spectroscopy (EDS) and electron back-scatter diffraction (EBSD), including native surfaces, depth profiles and cross-sections. We find that the native surface oxide is significantly tin-rich, we have measured depth profiles. We find that the grains apparent in the SEM images are individual crystallites having no evident relationship to the substrate or each other.
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Paper

Title

Page

Structure and Composition of Nb3Sn Diffusion Coated Films on Nb

669

J. Tuggle, M.J. Kelley
Virginia Polytechnic Institute and State University, Blacksburg, USA
G.V. Eremeev, M.J. Kelley, C.E. Reece
JLab, Newport News, Virginia, USA
M.J. Kelley, H. Xu
The College of William and Mary, Williamsburg, Virginia, USA

Funding: Co-authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. College of William & Mary supported by U.S. DOE Office of High Energy Physics under grant DE-SC-0014475
The structure and composition of Nb3Sn films obtained by diffusion coating niobium coupons and SRF cavities were investigated by x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS) and scanning electron microscopy (SEM) with energy-dispersive x-ray spectroscopy (EDS) and electron back-scatter diffraction (EBSD), including native surfaces, depth profiles and cross-sections. We find that the native surface oxide is significantly tin-rich, we have measured depth profiles. We find that the grains apparent in the SEM images are individual crystallites having no evident relationship to the substrate or each other.

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