Author: Verguet, A.
Paper Title Page
THPB095 Automatic RF Conditioning Test Bench of Fundamental Power Couplers for the European XFEL Accelerator 1367
 
  • S. Sierra, C. Lievin, P. Rouillon
    TED, Velizy-Villacoublay, France
  • H. Guler, W. Kaabi, A. Verguet
    LAL, Orsay, France
 
  In order to perform the RF conditioning of the fundamental coupler for the XFEL accelerator, Thales and LAL developed together a test bench being able to make the automatic RF conditioning. The capability of this test bench is of 4 pairs of coupler at the same time with automatic sequences of increasing the RF power. The test bench is composed of the overall RF station providing up to 5 MW peak power at 1.3 GHz. The waveguide distribution allows 4 individual RF lines for conditionning,and the automatic sequence applied to the couplers in respect with all signals monitored and controlled during the RF process. The paper will also provide some examples of such process.  
Export • reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text, ※ RIS/RefMan, ※ EndNote (xml)  
 
THPB102 RF Conditioning of the XFEL Power Couplers at the Industrial Scale 1387
 
  • H. Guler, A. Gallas, W. Kaabi, D.J.M. Le Pinvidic, C. Magueur, M. Oublaid, A. Thiebault, A. Verguet
    LAL, Orsay, France
 
  LAL has in charge the production monitoring and the RF conditioning of 800 power couplers to equip 100 XFEL cryomodules. The conditioning process and all the preceding preparation steps are performed in a 70m2 clean room. This infrastructure, its equipment and the RF station are designed to allow the treatment of 8 couplers in the same time, after a ramp-up phase. Clean room process and conditioning results are presented and discussed.  
Export • reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text, ※ RIS/RefMan, ※ EndNote (xml)