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For the characterization of SRF materials, we have commissioned a second-generation, X-band cavity cryostat that can rapidly analyze thin-film coatings or bulk samples. The system operates at 11.4 GHz, at temperatures down to 4 K, and utilizes two interchangeable hemispherical cavities (one Cu, one Nb) that can accommodate 51 mm-diameter samples on the flat side. The cavities are designed to operate with a TE032-like mode where the magnetic field is strongest on the sample surface. As a result, the sample accounts for 33% of the overall cavity loss, despite comprising less than 8% of the total surface area. For low-power testing we utilize a programmable network analyzer, while for high-power testing we connect the cavity to a 50 MW XL-4 klystron. With the Nb cavity we can measure surface resistances down to 0.7 microhm, while with the Cu cavity we can measure quenching fields up to 360 mT. X-band operation permits a compact cavity and cryostat design with a reasonable sample size, while the closed-cycle pulse-tube cryorefrigerator allows for rapid sample cycling. We will discuss cryostat design, cavity modeling, measurement limits, and recent sample testing results.
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